SKG Model |
Description |
Application |
DUT Size Range |
Frequency
Range |
Comments |
Agilent
Equivalent |
351,352,
353 |
C/DF
test tweezers |
C/DF
testing of MLCC |
01005
to 5640 |
5HZ to
100 MHZ |
|
16034A |
354, 355, 356 |
Kelvin test tweezers |
Low resistance - milli-ohm and micro ohm testing
of chip components. Chip
resistors, chip inductors, ferrite beads, chip fuses, any other two terminal
chip component requiring a low value, DCR test. |
0201 to 5640 |
DC |
True Kelvin test circuit. Can be equipped with BNC or banana
plugs |
none |
357,
358 |
Tweezers
style probe |
C/DF test of MLCC chips in tape (tape/reel
pack), capacitors on circuit boards, etc. |
01005
to 5640 |
5HZ to
100 MHZ |
357
for smaller chips, 358 for larger chips |
none |
359A |
Kelvin tweezers style probe |
Any low value resistance measurement using Agilent
4338A/B, also 100 KHZ ESR testing of tantalum capacitors mounted on cirucit
boards using Agilent 4263B |
0402 to 5640 |
100HZ to 100 KHZ |
True Kelvin test circuit for use over frequency
range 100HZ to 100 KHZ |
none |
359B |
Kelvin
tweezers style probe |
Low
value DCR testing chips in tape (tape/reel pack), resistors on circuit
boards, etc. |
0402
to 5640 |
DC |
True
Kelvin test circuit. For meters
with banana jacks |
none |
361B, 362B, 363B |
Insulation resistance test tweezers |
IR testing on MLCC |
01005 to 5640 |
DC |
Used on any IR meter that has banana jacks |
|
361A,
362A, 363A |
Insulation
resistance test tweezers |
IR
testing on MLCC |
01005
to 5640 |
DC |
4339A/B
uses special connectors, meter specific model |
16118A |
550B, 550A |
Kelvin precision test fixture |
Low value DCR testing of chip components, for example, resistors, common mode
chokes, inductors, ferrite beads, fuses, etc. |
0402 up to 3/4" long |
DC to 10 MHZ |
True Kelvin test fixture, can be equipped with
banana jacks or BNC connectors |
16044A |
560A,
560B |
Precision
test fixture for Insulation Resistance testing |
IR
testing on MLCC |
01005
to 5640 |
DC |
Equipped
with banana plugs, BNC connectors or special connectors for Agilent 4339A/B,
shielded metal box for safety and better test performance |
16339A |
570 |
C/DF precision test fixture |
C/DF testing on MLCC |
01005 up to 5640 |
100HZ to 20 MHZ |
|
16034E |
600 |
Vertical
test fixture |
C/DF
testing on single layer capactors (SLC) |
any
size SLC |
100HZ
to 20 MHZ |
|
none |
601 |
Vertical test fixture |
C/DF testing of DUT with two bottom terminations |
0201 up to 1812 |
100HZ to 20 MHZ |
|
none |
700 |
Kelvin
clips, 17mm maximum opening between jaws, for testing larger DUT's |
C/DF
testing of leaded chip capacitors, 100 KHZ testing on tantalum capacitors,
DCR testing on any leaded component |
axial
or radial leaded parts, also any component having features that can be
gripped by this size Kelvin clip |
5Hz to
100 KHZ |
Can be
equipped with BNC connectors (700A) or banana plugs (700B) or the use can
install BNC to banana plug adaptors for use on meters equipped with banana
jacks |
16089A |
701 |
Kelvin clips, 6mm maximum opening between jaws,
for testing medium size DUT's |
C/DF testing of leaded chip capacitors, 100 KHZ
testing on tantalum capacitors, DCR testing on any leaded component |
axial or radial leaded components, also any
component having featrues that can be gripped by this size Kelvin clip |
5Hz to 100 KHZ |
Can be equipped with BNC connectors (701A) or
banana plugs (701B) or the use can install BNC to banana plug adaptors for
use on meters equipped with banana jacks |
16089B |
800A,
800R |
Axial
and radial part bench fixture |
C/DF
testing of leaded chip capacitors |
N/A |
100HZ
to 15MHz |
|
16047A |
801A, 801R |
Axial and radial part bench fixture |
IR testing for axial and radial leaded capacitors |
N/A |
DC |
Equipped with shielded box for operator safety |
16339A |
802A,
802R |
Kelvin
bench fixture for leaded parts |
4
terminal Kelvin testing of axial and radial leaded components |
N/A |
DC to
10 MHZ |
|
16047E |
|
|
|
|
|
|
|
|
|
Meter
Specific Fixtures, Cable sets and Accessolries |
|
|
|
|
4339-100 |
Shunt connector for Agilent 4339A/B |
Required for operation of 4339A/B |
N/A |
DC |
Plug & Play replacement for Agilent 04339-0003
shunt connector |
04339-0003 |
4339-106 |
low
noise test lead set |
Connecting
4339A/B to custom fixture |
N/A |
DC |
Plug
& Play replacement for Agilent 16117C low noise test leads |
16117C |
361A, 362A, 363A |
IR tweezers for use with Agilent 4339A/B |
IR testing on MLCC's using Agilent 4339A/B |
01005 to 5840 |
DC |
Plug and play replacement for Agilnet 16118A |
16118A |
560A |
Bench
fixture for IR testing on MLCC's |
IR
testing on MLCC's using Agilent 4339A/B |
01005
to 5840 |
DC |
Plug
and play replacement for Agilnet 16339A |
16339A |
700A |
Kelvin clip for use on Agilent 4338A/B |
milli-ohm testing on components using 4338A/B, max
opening between clip jaws is 17MM |
N/A |
1 KHZ |
Plug & Play replace for HP 16143B mating cable
and HP 16005B large Kelvin clips with a larger opening between clip jaws |
16143B + 16005B |
701A |
Kelvin
clip for use on Agilent 4338A/B |
milli-ohm
testing on components using 4338A/B, max opening between clip jaws is 6MM |
NA |
1 KHZ |
Plug
& Play replace for HP 16143B mating cable and HP 16005B large Kelvin
clips |
16143B
+ 16005B |
354A, 355A, 356A |
Kelvin test tweezers for use with Agilent 4338B |
Milli-ohm testing on chip components components
using 4338A/B |
0201 to 5840 |
1 KHZ |
HP / Agilent did not offer a Kelvin tweezers
option for the 4338A/B |
16143B + SKG Kelvin tweezers |